Specifications

All specifications are typical unless noted otherwise. All specifications apply to all models unless noted otherwise.

Model overview​

Vertical system analog channels

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Bandwidth limits (limited by instrument bw):

20 MHz, 70 MHz, 100 MHz, 200 MHz, 350 MHz, and 500 MHz

Input coupling: AC, DC

 

Input impedance

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BNC: 1 MΩ ± 1%, 14 pF ± 3 pF

TPP0200 probe tip: 10 MΩ, < 12 pF

P6139B probe tip: 10 MΩ, < 8 pF

Input sensitivity range: 1 mV/div to 10 V/div

Vertical resolution: 8 Bit

Maximum input voltage: 

300 Vrms CAT II with peaks < ±425 V

Derate at 20 dB/decade between 4.5 MHz to 45 MHz

Derate at 14 dB between 45 MHz to 450 MHz; above 450 MHz, 5 Vrms

DC gain accuracy: ±3% derated at 0.10%/°C above 30 °C

Channel to channel isolation: 100:1 <= 100 MHz, 30:1 > 100 MHz

Offset range:

1 mV/div to 63.8 mV/div : +/-1 V

63.9 mV/div to 999.5 mV/div : +/-10 V

1 V/div to 10 V/div : +/-100 V

 

Horizontal system analog channels

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Timebase range

2 ns/div to 1000 s/div (all channel)

1 ns/div to 1000 s/div (half channel)

Timebase delay range

-10 divisions to 5000s

Channel to channel deskew range

-95 ns to +95 ns

Timebase accuracy:

± 25 ppm over any ≥1 ms interval

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Trigger system

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Trigger modes: 

Auto, normal, and single

Trigger coupling: 

DC, HF Reject (attenuates > 50 kHz), LF Reject (attenuates < 50 kHz), noise reject (reduces sensitivity)

Trigger holdoff range: 

0 s to 10 s

Trigger sensitivity: 

Edge type, DC coupled

Any analog input channel: the greater of 6 mV or 0.8 div

Aux In: 500 mVpp to 250 MHz

 

Trigger level ranges

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Any input channel: ±5 divisions from center of screen

Aux In: ±8 V

Trigger frequency counter: Provides frequency readout of triggerable events.

 

Trigger types

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Edge: Positive, negative, or either slope on any channel.

Pulse Width: 

Trigger on width of positive or negative pulses. Event can be time- or logic-qualified

Timeout: 

Trigger on an event which remains high, low, or either, for a specified time period. Event can be logic-qualified

Runt: 

Trigger on a pulse that crosses one threshold but fails to cross a second threshold before crossing the first again. Event can be time- or logic-qualified

Logic: 

Trigger when logic pattern goes true, goes false, or occurs coincident with a clock edge. Pattern (AND, OR, NAND, NOR) specified for all input channels defined as high, low, or don't care. Logic pattern going true can be time-qualified

Setup/Hold: 

Trigger on violations of both setup time and hold time between clock and data present on any input channels

Rise/Fall: 

Trigger on pulse edge rates that are faster or slower than specified. Slope may be positive, negative, or either. Event can be logic-qualified

Parallel (with MSO option):

Trigger on a parallel bus data value. Parallel bus can be from 1 to 20 bits (from the digital and analog channels) in size. Supports binary and hex radices

I2C (option):

Trigger on start, repeated start, stop, missing ack, address (7 or 10 bit), data, or address and data on I2C buses up to 10 Mb/s

SPI (option):

Trigger on slave select, idle time, or data (1-16 words) on SPI buses up to 20 Mb/s

RS-232/422/485/UART (option):

Trigger on start bit, end of packet, data, and parity error up to 15 Mb/s

CAN (option):

Trigger on start of frame, type of frame (data, remote, error, or overload), identifier, data, identifier and data, end of frame, missing ack, and bit stuff error on CAN buses up to 1 Mb/s

LIN (option): 

Trigger on sync, identifier, data, identifier and data, wakeup frame, sleep frame, and error on lin buses up to 1 Mb/s

SENT (option):

Trigger on start of packet, fast channel status and data, slow channel message ID and data, and CRC errors

 

Acquisition system modes

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Sample: Acquired sample values

Peak Detect: Highest and the lowest sample within the decimation interval

Averaging: Average of a series of acquired waveforms up to 10,240 acquisitions

Envelope: Min-Max envelope over multiple acquisitions

Hi-Res: 

Applies a unique bandwidth filter for each sample rate that maintains the maximum bandwidth possible for that sample rate while preventing aliasing and removing noise from the oscilloscope amplifiers and ADC above the usable bandwidth for the selected sample rate.

 

Waveform measurements

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Cursors: Waveform, V bars, H bars, and V&H bars

Automatic measurements: 

36, of which an unlimited number can be displayed as either individual measurement badges or collectively in a measurement results table

Amplitude measurements: 

Amplitude, maximum, minimum, peak-to-peak, positive overshoot, negative overshoot, mean, RMS, AC RMS, top, base, and area

Time measurements: 

Period, frequency, unit interval, data rate, positive pulse width, negative pulse width, skew, delay, rise time, fall time, phase, rising slew rate, falling slew rate, burst width, positive duty cycle, negative duty cycle, time outside level, setup time, hold time, duration n-periods, high time, and low time, time to max, and time to min

Measurement statistics: 

Mean, standard deviation, maximum, minimum, and population. Statistics are available on both the current acquisition and all acquisitions

Reference levels: 

User-definable reference levels for automatic measurements can be specified in either percent or units. Reference levels can be set to global for all measurements, per source channel or signal, or unique for each measurement

Gating: 

Screen, cursors, logic, search, or time. specifies the region of an acquisition in which to take measurements. Gating can be set to global (affects all measurements set to global) or local (all measurements can have a unique time gate setting; only one local gate is available for screen, cursors, logic, and search actions).

 

Waveform math

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Arithmetic: 

Add, subtract, multiply, and divide

Math Functions: 

Integrate, differentiate, log 10, log e, square root, exponential, and abs

Relational: 

Boolean result of comparison >, <, ≥, ≤, =, and ≠

Logic: AND, OR, NAND, NOR, XOR, and EQV

FFT: 

Spectral magnitude and phase, and real and imaginary spectra

FFT units: 

Magnitude: linear and log (dBm)

Phase: degrees, radians, and group delay

FFT window functions:

Hanning, rectangular, hamming, blackman-harris, flattop2, gaussian, kaiser-bessel, and tekexp

 

Search

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Search Types:

Search through long records to find all occurrences of user specified criteria including edges, pulse widths, timeouts, runt pulses, logic patterns, setup & hold violations, rise/fall times, and bus protocol events.

Search results:

Waveform view, results table.

 

Arbitrary function generator

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Number of channels:

1 (Multiplexed with Aux Out)

Operating modes: Continuous, burst

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Waveforms:

Sine, square, pulse, ramp, triangle, dc, noise, sin(x)/x(sinc), gaussian, lorentz, exponential rise, exponential decay, haversine, cardiac, and arbitrary

Amplitude and frequency range:

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DC offset

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DC offset range:

±2.5 V into Hi-Z, ±1.25 V into 50 Ω

DC offset resolution:

1 mV into Hi-Z, 500 uV into 50 Ω

DC offset accuracy:

±[(1.5% of absolute offset voltage setting) + 1 mV]

 

Digital pattern generator

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Number of channels: 4

Pattern memory length: 2 K bits

Output amplitude:

2.5 V, 3.3 V, 5 V, and Hi-Z

Pattern type:

Square, counter, user defined, and manual

 

Digital voltmeter and frequency counter

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Source: Ch1, Ch2, Ch3, Ch4

Measurement types:

ACrms, DCrms, and AC+DCrms

Resolution:

Voltage: 4 digits

Frequency: 5 digits

Vertical settings auto range:

Automatic adjustment of vertical settings to maximize measurement dynamic range

 

Display

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Display type:

10.1 Inch LCD capacitive touch display

Display resolution:

1280 x 800

Display modes:

Overlay

Stacked

Zoom:

Horizontal and vertical zooming is supported in all waveform and plot views.

Interpolation:

Sin(x)/x and linear

Waveform styles:

Vectors, dots, variable persistence, and infinite persistence

Graticules:

Movable and fixed graticules, selectable between grid, time, full, and none

Color palettes:

Normal and inverted for screen captures

Individual waveform colors are user-selectable

Format: YT, XY

Language support:

English, Japanese, Simplified Chinese, Traditional Chinese, French, German, Italian, Spanish, Portuguese, Russian, Korean

 

Input/Output ports

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USB interface: 

Two USB 2.0 host ports

One USB device port (providing USBTMC support)

Ethernet interface:

One ethernet port, 10/100 Mb/s, and 1000 Mbps ethernet (in full duplex mode only)

 

Probe compensation signal

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Amplitude: 0 to 2.5 V

Frequency: 1 kHz

Source impedance: 1 kΩ

Aux out:

Front panel BNC connector multiplexed with AFG out. Output can be configured to provide a positive or negative pulse when oscilloscope triggers.​

Aux input:

300 Vrms CAT II with peaks ≤ ±425 V

Security lock:

Rear-panel security slot connects to standard Kensington-style lock.

VESA mount:

Standard (VESA MIS-D 100) 100 mm x 100 mm VESA mounting points on rear of instrument

Ground lug:

Provides a safe ground return path when the instrument is operating on battery.

 

Software

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VNC:

Remotely control and view the screen on the instrument

IVI Driver:

Provides a standard instrument programming interface for common applications such as LabVIEW, LabWindows/CVI, Microsoft .NET, and MATLAB. Compatible with python, C/C++/C# and many other languages through VISA.

TekScope:

TekScope brings the power of the oscilloscope analysis environment to the PC. You can have the flexibility to perform analysis tasks including serial decode, power analysis, timing, eye, and jitter analysis outside the lab. Visit https://www.tek.com/software/tekscope-pc-analysis-software to learn more.

TekDrive:

Upload, store, organize, search, download, and share any file type from any connected device. TekDrive is natively integrated into the 2 Series MSO for seamless sharing and recalling of files - no USB stick is required. Visit http://www.tek.com/software/tekdrive to learn more.

Programming examples:

Programming with the 2/4/5/6 Series platforms has never been easier. With a programmers manual and a GitHub site you have many commands and examples to help you get started remotely automating your instrument. See https://github.com/TEKTRONIX/PROGRAMMATIC-CONTROL-EXAMPLES

 

Power

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Line power:

100 - 240 V ± 10% at 50 Hz to 60 Hz

AC Adapter output:

24 V DC, 2.71 A

Power consumption: 60 W (max)

 

Battery

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Battery power:

Requires Opt 2-BP battery pack, with 2 slots for batteries

Supports up to 2 TEKBAT-01 Li-Ion rechargeable batteries

Cell chemistry: Li-lon

Nominal capacity: 6700 mAh

Voltage: 14.52 VDC

Weight: 450 g/1lb

Operating time, typical:

Up to 4 hours single battery

Up to 8 hours dual batteries

Hot swappable

 

Physical characteristics

Dimensions

Instrument only

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Height: 210 mm (8.26 in)

Width: 344 mm (13.54 in)

Depth: 40.4 mm (1.59 in)

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Instrument with battery pack

Height: 210 mm (8.26 in)

Width: 344 mm (13.54 in)

Depth: 78 mm (3.07 in)

 

Weight

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Instrument only: 1.8 kg (4 lbs)

Instrument with battery pack: 

3.2 kg (7 lbs) – one battery

3.6 kg (8 lbs) – two batteries

Rackmount configuration: 5U

Cooling clearance:

2 in required on left side, right side and rear of the instrument

 

EMC, environmental, and safety

Temperature

Operating:

0 °C to +50 °C (+32 °F to 120 °F)

Operating battery:

Charge 0 °C to 45 °C (+32 °F to 113 °F)

Discharge -20 °C to 60 °C (-4 °F to 140 °F)

Non-operating:

-20 °C to +60 °C (-4 °F to 140 °F)

Humidity

Operating:

5% to 90% relative humidity at temperatures up to +30 °C,

5% to 60% relative humidity at temperatures greater than +30 °C and up to +50 °C.

Non-operating:

5% to 90% relative humidity at temperatures up to +30 °C,

5% to 60% relative humidity at temperatures greater than +30°C and up to +60 °C.

Altitude

Operating:

Up to 3,000 meters (9,842 feet)

Non-operating:

Up to 12,000 meters (39,370 feet)

 

Regulatory

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CE marked for the European Union and UL approved for the USA and Canada

RoHS compliant

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• Tektronix is registered to ISO 9001 and ISO 14001 by SRI Quality System Registrar.Product(s) complies with IEEE Standard 488.1-1987, RS-232-C, and with Tektronix Standard Codes and Formats.Product Area Assessed: The planning, design/development and manufacture of electronic Test and Measurement instruments.

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