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Keithley 2400 Source Meter

Keithley 2400 Source Meter

SKU: SMU2400


Keithley’s Standard Series 2400 Source Measure Unit (SMU) Instruments offer four-quadrant precision voltage and current source/load coupled with measurement. Each SMU instrument is both a highly stable DC power source and a true instrument-grade 6½-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise.

Only 1 left in stock
  • Description

    Key Features


    • Five instruments in one (IV Source, IVR Measure)
    • Five models: 20–100 W DC, 1000 W pulsed, 1100 V to 1 µV
    • Source and sink (4-quadrant) operation
    • 0.012% basic measure accuracy with 6½-digit resolution
    • 2-, 4-, and 6-wire remote V-source and measure sensing
    • 1700 readings/second at 4½ digits via GPIB
    • Pass/Fail comparator for fast sorting/binning
    • Programmable DIO port for automation/handler/prober control (except 2401)
    • Standard SCPI GPIB, RS-232 and Keithley Trigger Link interfaces
    • Download KickStart today and try it out for 60 days


    Keithley’s Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as measurement capabilities. Each SourceMeter SMU instrument is both a highly stable DC power source and a true instrument-grade 6½-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, these instruments can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the SourceMeter SMU instruments invaluable for a wide range of characterization and production test applications.


    Advantages of a Tightly Integrated Instrument

    By linking source and measurement circuitry in a single unit, these instruments offer a variety of advantages over systems configured with separate source and measurement instruments. For example, they minimize the time required for test station development, setup, and maintenance, while lowering the overall cost of system ownership. They simplify the test process itself by eliminating many of the complex synchronization and connection issues associated with using multiple instruments. And, their compact half-rack size conserves precious “real estate” in the test rack or bench.


    Power of Five Instruments in One (IV Source, IVR Measure)

    The tightly coupled nature of a SourceMeter SMU instrument provides many advantages over solutions configured from separate instruments, such as a precision power supply and a digital multimeter. For example, it provides faster test times by reducing GPIB traffic and simplifies the remote programming interface. It also protects the device under test from damage due to accidental overloads, thermal runaway, etc. Both the current and voltage source are programmable with readback to help maximize device measurement integrity. If the readback reaches a programmed compliance limit, then the source is clamped at the limit, providing fault protection.


    I-V Characteristics

    All SourceMeter SMU instruments provide four-quadrant operation. In the first and third quadrants they ­operate as a source, delivering power to a load. In the second and fourth quadrants they operate as a sink, ­dissipating power internally. Voltage, current, and resistance can be measured during source or sink ­operation.


    Automation for Speed

    A SourceMeter SMU instrument streamlines production testing. It sources voltage or current while making measurements without needing to change connections. It is designed for reliable operation in non-stop production environments. To provide the throughput demanded by production applications, the SourceMeter SMU instrument offers many built-in features that allow it to run complex test sequences without computer control or GPIB communications slowing things down.


    Standard and Custom Sweeps

    Sweep solutions greatly accelerate testing with automation hooks. Three basic sweep waveforms are provided that can be programmed for single-event or continuous operation. They are ideal for I/V, I/R, V/I, and V/R characterization.

    • Linear Staircase Sweep: Moves from the start level to the stop level in equal linear steps
    • Logarithmic Staircase Sweep: Done on a log scale with a specified number of steps per decade
    • Custom Sweep: Allows construction of special sweeps by specifying the number of measurement points and the source level at each point
    • Up to 1700 readings/second at 4½ digits to the GPIB bus
    • 5000 readings can be stored in the non-volatile buffer memory


    Built-In Test Sequencer (Source Memory List)

    The Source Memory list provides faster and easier testing by allowing you to setup and execute up to 100 different tests that run without PC intervention.

    • Stores up to 100 instrument configurations, each containing source settings, measurement ­settings, pass/fail criteria, etc.
    • Pass/fail limit test as fast as 500 µs per point
    • Onboard comparator eliminates the delay caused when sending data to the computer for analysis
    • Built-in, user definable math functions to calculate derived parameters


    Digital I/O Interface

    The digital I/O interface can link a SourceMeter SMU instrument to many popular component handlers, including Aetrium, Aeco, and Robotronics. Other capabilities of the interface include:

    • Tight systems integration for applications such as binning and sorting
    • Built-in component handler interface
    • Start of test and end of test signals
    • 5 V, 300 mA power supply
    • Optional expander accessory (2499-DIGIO) adds 16 digital I/O lines

    The digital I/O interface is available on all Series 2400 SoourceMeter instruments except the 2401.


    Trigger Link Interface

    All SourceMeter SMU instruments include Keithley’s unique Trigger Link interface, which provides high-speed, seamless communications with many of Keithley’s other instruments independent of a computer and GPIB.


    Unique 6-Wire Ohms Technique

    SourceMeter SMU instruments can make standard 4-wire, split Kelvin, and 6-wire, guarded ohms measurements and can be configured for either the constant current or constant voltage method. The 6-wire ohms technique:

    • Uses guard and guard sense leads in addition to the 4-wire sense and source leads.
    • Locks out parallel current paths when measuring resistor networks or hybrid ­circuits to isolate the component under test.
    • Allows users to configure and plot data easily from Series 2400 SourceMeter SMU instruments, making characterization of two, three, and four terminal devices a snap.

    Note: The above description of product is quoted from Keithley 2450 datasheet.

  • ​​​​​​​Specs at a glance

    Download the datasheet from Tektronix HERE 


    Key performance specifications


    Range Programming Resolution Source 1

    Accuracy (1 Year)23°C ±5°C±(% rdg. + volts)
    Default Measurement Resolution Measurement 2, 3, 4 Accuracy (1 Year)23°C ±5°C±(% rdg. + volts) Output Slew Rate (±30%) Source/Sink Limit
    200.000 mV 5 µV 0.02% + 600 µV 1 µV 0.012% + 300 µV   ±21 V @ ±1.05 A
    ±210 V @ ±105 mA
    2.00000 V 50 µV 0.02% + 600 µV 10 µV 0.012% + 300 µV   ±21 V @ ±1.05 A
    ±210 V @ ±105 mA
    20.0000 V 500 µV 0.02% + 2.4 mV 100 µV 0.015% + 1.5 mV 0.08 V/µs ±21 V @ ±1.05 A
    ±210 V @ ±105 mA
    200.000 V 5 mV 0.02% + 24 mV 1 mV 0.015% + 10 mV 0.5 V/µs ±21 V @ ±1.05 A
    ±210 V @ ±105 mA
  • Typical applications

    Typical Applications

    Ideal for current/voltage characterization and functional test of a wide range of today’s modern electronics and devices, including:

    • Nanomaterials and Devices
      • Graphene
      • Carbon nanotubes
      • Nanowires
      • Low power nanostructures


    • Semiconductor Structures
      • Wafers
      • Thin films


    • Organic Materials and Devices
      • E-inks
      • Printable electronics


    • Energy Efficiency and Lighting
      • LEDs/AMOLEDs
      • Photovoltaics/Solar cells
      • Batteries


    • Discrete and Passive Components
      • Two-leaded: Resistors, diodes, zener diodes, LEDs, disk drive heads, sensors
      • Three-leaded: Small signal bipolar junction transistors (BJTs), field effect transistors (FETs), and more


    • Material Characterization
      • Resistivity
      • Hall Effect
      • High ohmic resistance (using triax connectors)


    • Electrochemistry
      • Cyclic voltammetry
      • Battery charge/discharge cycling
      • Electro-deposition


    Note: The above description of product is quoted from Tektronix original description.

  • Comparison Table: 2400 vs 2450

    Model 2400 Model 2450
    V-Ranges: 200 mV – 200 V V-Ranges: 20 mV – 200 V
    I-Ranges: 1 μA – 1 A I-Ranges: 10 nA – 1 A
    0.012% Basic Accuracy 0.012% Basic Accuracy
    Wideband Noise: 4 mVrms Typ. Wideband Noise: 2 mVrms Typ.
    Sweep Types: Linear, Log, Custom, Source-Memory Sweep Types: Linear, Log, Dual Linear, Dual Log, Custom,
    Source-Memory (SCPI 2400 Mode)
    5000 Point Reading Buffer >250,000 Point Reading Buffer
    >2000 Readings/Second >3000 Readings/Second
    SCPI Programming SCPI (2400 + 2450) + TSP Programming
    PC Connection: GPIB PC Connection: GPIB, USB, Ethernet (LXI)
    Front/Rear Banana Jacks Front: Banana Jacks, Rear: Triax


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